Scanning tunnelling microscopy of suspended graphene

Recep Zan; Chris Muryn; Ursel Bangert; Philip Mattocks; Paul Wincott; David Vaughan; Xuesong Li; Luigi Colombo; Rodney S. Ruoff; Bruce Hamilton; Konstantin S. Novoselov

doi:10.1039/C2NR30162H

Scanning tunnelling microscopy of suspended graphene

Recep Zan,*^ab Chris Muryn,^c Ursel Bangert,^b Philip Mattocks,^d Paul Wincott,^e David Vaughan,^e Xuesong Li,^fg Luigi Colombo,^h Rodney S. Ruoff,^f Bruce Hamilton^d and Konstantin S. Novoselov^a

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* Corresponding authors

^a School of Physics and Astronomy, The University of Manchester, Manchester, UK
E-mail: recepzan@gmail.com
Tel: +44 (0)161 306 2255

^b School of Materials, The University of Manchester, Manchester, UK

^c School of Chemistry, The University of Manchester, Manchester, UK

^d Photon Science Institute, The University of Manchester, Manchester, UK

^e School of Earth, Atmospheric and Environmental Sciences, The University of Manchester, Manchester, UK

^f Department of Mechanical Engineering and the Materials Science and Engineering Program, The University of Texas at Austin, Austin, TX, USA

^g IBM, T.J. Watson Research Center, Yorktown, NY, USA

^h Texas Instruments Incorporated, Dallas, TX 75243, USA

Abstract

Suspended graphene has been studied by STM for the first time. Atomic resolution on mono- and bi-layer graphene samples has been obtained after ridding the graphene surface of contamination via high-temperature annealing. Static local corrugations (ripples) have been observed on both types of structures.

Nanoscale

Scanning tunnelling microscopy of suspended graphene

Abstract

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