Issue 16, 2016

Oxidation behaviour of lattice oxygen in Li-rich manganese-based layered oxide studied by hard X-ray photoelectron spectroscopy

Abstract

The oxidation/reduction behaviours of lattice oxygen and transition metals in a Li-rich manganese-based layered oxide Li[Li0.25Ni0.20Mn0.55]O1.93 are investigated by using hard X-ray photoelectron spectroscopy (HAX-PES). By making use of its deeper probing depth rather than in-house XPS analyses, we clearly confirm the formation of O ions as bulk oxygen species in the active material. They are formed on the 1st charging process as a charge compensation mechanism for delithiation and decrease on discharging. In particular, the cation–anion dual charge compensation involving Ni and O ions is suggested during the voltage slope region of the charging process. The Ni ions in the material are considered to increase the capacity delivered by a reversible anion redox reaction with the suppression of O2 gas release. On the other hand, we found structural deterioration in the cycled material. The O species are still observed but are electrochemically inactive during the 5th charge–discharge cycle. Also, the oxidation state of Ni ions is divalent and inactive, although that of Mn ions changes reversibly. We believe that this is associated with the structural rearrangement occurring after the activation process during the 1st charging, leading to the formation of spinel- or rocksalt-like domains over the sub-surface region of the particles.

Graphical abstract: Oxidation behaviour of lattice oxygen in Li-rich manganese-based layered oxide studied by hard X-ray photoelectron spectroscopy

Supplementary files

Article information

Article type
Paper
Submitted
05 Feb 2016
Accepted
18 Mar 2016
First published
18 Mar 2016
This article is Open Access
Creative Commons BY license

J. Mater. Chem. A, 2016,4, 5909-5916

Oxidation behaviour of lattice oxygen in Li-rich manganese-based layered oxide studied by hard X-ray photoelectron spectroscopy

K. Shimoda, T. Minato, K. Nakanishi, H. Komatsu, T. Matsunaga, H. Tanida, H. Arai, Y. Ukyo, Y. Uchimoto and Z. Ogumi, J. Mater. Chem. A, 2016, 4, 5909 DOI: 10.1039/C6TA01152G

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