Issue 17, 2011

Direct stress measurements in thin polymer films

Abstract

Stresses in thin polymer films were quantitatively determined by measuring the deflection of a cantilever cut from a film-covered silicon nitride membrane using a focused ion beam. Spin-cast high molecular weight films showed a surprisingly high residual stress, which by far exceeded the tensile strength of the bulk polymer. Thermal annealing relaxed these stresses suggesting two relaxation mechanisms, both of which are much faster than the reptation time.

Graphical abstract: Direct stress measurements in thin polymer films

Article information

Article type
Paper
Submitted
08 Apr 2011
Accepted
15 Apr 2011
First published
27 May 2011

Soft Matter, 2011,7, 7839-7842

Direct stress measurements in thin polymer films

K. R. Thomas and U. Steiner, Soft Matter, 2011, 7, 7839 DOI: 10.1039/C1SM05634D

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