Issue 12, 2013

The identification, characterization and mitigation of defect states in organic photovoltaic devices: a review and outlook

Abstract

In any microelectronic device, fundamental physical parameters must be well understood for successful electronic optimization. One such prominent parameter is energetic trap states, which are well-known to plague amorphous or otherwise impure semiconducting materials. Organic semiconductors are no strangers to such states and their electronic properties are evidently tied to these defects. Herein, this article discusses the identification, characterization and mitigation of bandgap residing trap levels in organic photovoltaic devices. A compilation of select studies to date is given and a general outlook is proposed. Organic photovoltaic materials are depicted as multiple trap-level systems with a seemingly continuous distribution of electronic states throughout the bandgap. Some elucidations as to the origins of these electronic states as well as recent works centered on defect removal are also presented.

Graphical abstract: The identification, characterization and mitigation of defect states in organic photovoltaic devices: a review and outlook

Article information

Article type
Review Article
Submitted
31 May 2013
Accepted
29 Aug 2013
First published
30 Aug 2013

Energy Environ. Sci., 2013,6, 3414-3438

The identification, characterization and mitigation of defect states in organic photovoltaic devices: a review and outlook

J. A. Carr and S. Chaudhary, Energy Environ. Sci., 2013, 6, 3414 DOI: 10.1039/C3EE41860J

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