Issue 25, 2007
From the journal:

Journal of Materials Chemistry

Parallel structural screening of solid materials†

Jan-Dierk Grunwaldt,*a   Bertram Kimmerle,a   Stefan Hannemann,a   Alfons Baiker,a   Pit Boyeb  and  Christian G. Schroerb  

* Corresponding authors

a Department of Chemistry and Applied Biosciences, ETH Zurich, Hönggerberg – HCI, CH-8093 Zürich, Switzerland
E-mail: grunwaldt@chem.ethz.ch
Fax: +41 44 632 11 63

b Institute of Structural Physics, TU Dresden, D-01062 Dresden, Germany

Abstract

X-Ray absorption spectroscopy using a microreactor array in combination with an X-ray camera is applied for fast parallel structural screening of a variety of differently prepared supported palladium and copper particles in the as-prepared state and after heat pre-treatments in different gas atmospheres.

Graphical abstract: Parallel structural screening of solid materials

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Article information

DOI
https://doi.org/10.1039/B705334G
Article type
Communication
Submitted
10 Apr 2007
Accepted
04 May 2007
First published
16 May 2007

J. Mater. Chem., 2007,17, 2603-2606

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Parallel structural screening of solid materials

J. Grunwaldt, B. Kimmerle, S. Hannemann, A. Baiker, P. Boye and C. G. Schroer, J. Mater. Chem., 2007, 17, 2603 DOI: 10.1039/B705334G

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