Electrochemical impedance spectroscopy and surface plasmon resonance studies of DNA hybridization on gold/SiOx interfaces†
Abstract
The use of Au/SiOx interfaces for the investigation of DNA hybridization using
* Corresponding authors
a
Laboratoire d'Electrochimie et de Physicochimie des Matériaux et des Interfaces (LEPMI), CNRS-INPG-UJF, 1130 rue de la piscine, BP 75, 38402 St. Martin d'Hères Cedex, France
E-mail:
sabine.szunerits@enseeg.inpg.fr
Fax: +33 04 76 82 66 30
Tel: +33 04 76 82 65 52
b LMGP, Laboratoire des Matériaux et du Génie Physique, INP Grenoble, Minatec, 3 parvis Louis Néel, BP 257, 38016 Grenoble Cedex 1, France
c Institut de Recherche Interdisciplinaire (IRI, USR-3078) and Institut d'Electronique, de Microélectronique et de Nanotechnologie (IEMN, CNRS-8520), Cité Scientifique, Avenue Poincaré – B.P. 60069, 59652 Villeneuve d'Ascq, France
The use of Au/SiOx interfaces for the investigation of DNA hybridization using
M. Manesse, V. Stambouli, R. Boukherroub and S. Szunerits, Analyst, 2008, 133, 1097 DOI: 10.1039/B804825H
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