Issue 29, 2009

Advances in total scattering analysis

Abstract

In recent years the analysis of the total scattering pattern has become an invaluable tool to study disordered crystalline and nanocrystalline materials. Traditional crystallographic structure determination is based on Bragg intensities and yields the long range average atomic structure. By including diffuse scattering into the analysis, the local and medium range atomic structure can be unravelled. Here we give an overview of recent experimental advances, using X-rays as well as neutron scattering as well as current trends in modelling of total scattering data.

Graphical abstract: Advances in total scattering analysis

Article information

Article type
Feature Article
Submitted
26 Nov 2008
Accepted
27 Feb 2009
First published
31 Mar 2009

J. Mater. Chem., 2009,19, 5078-5088

Advances in total scattering analysis

T. Proffen and H. Kim, J. Mater. Chem., 2009, 19, 5078 DOI: 10.1039/B821178G

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