Issue 4, 2011
From the journal:

Analytical Methods

The application of statistical methodology to the analysis of time-resolved X-ray diffraction data†

Jonathan C. Burley,*a   Dermot O'Hareb  and  Gareth R. Williams*bc  

* Corresponding authors

a Laboratory of Biophysics and Surface Analysis, School of Pharmacy, Boots Science Building, University of Nottingham, University Park, Nottingham, UK
E-mail: jonathan.burley@nottingham.ac.uk
Tel: +44 (0) 115 84 68357

b Chemistry Research Laboratory, Department of Chemistry, University of Oxford, Mansfield Road, Oxford, UK

c School of Human Sciences, London Metropolitan University, 166-220 Holloway Road, London, UK
E-mail: g.williams@londonmet.ac.uk
Tel: +44 207 133 2565

Abstract

We demonstrate for the first time the application of Principal Component Analysis (PCA) to the analysis of time-resolved energy-dispersive X-ray diffraction data. Previously well-characterised model systems are studied. PCA is shown to offer significant advantages over traditional curve-fitting methods in terms of speed and lack of potential user bias.

Graphical abstract: The application of statistical methodology to the analysis of time-resolved X-ray diffraction data

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Article information

DOI
https://doi.org/10.1039/C0AY00772B
Article type
Paper
Submitted
21 Dec 2010
Accepted
03 Feb 2011
First published
25 Feb 2011

Anal. Methods, 2011,3, 814-821

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The application of statistical methodology to the analysis of time-resolved X-ray diffraction data

J. C. Burley, D. O'Hare and G. R. Williams, Anal. Methods, 2011, 3, 814 DOI: 10.1039/C0AY00772B

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