Issue 47, 2014

Spectroscopic characterization of the interaction of lithium with thin films of the ionic liquid 1-octyl-3-methylimidazolium bis(trifluoromethylsulfonyl)amide

Abstract

In this experimental investigation the interaction of lithium with 1-octyl-3-methylimidazolium bis(trifluoromethylsulfonyl)amide ([OMIm]Tf2N) is shown. For this purpose thin films of lithium and [OMIm]Tf2N were successively vapor deposited on a copper substrate and analyzed by X-ray Photoelectron Spectroscopy (XPS) as well as by Ultraviolet Photoelectron Spectroscopy (UPS). When [OMIm]Tf2N is evaporated on top of a thin lithium film a chemical shift analysis of XPS spectra shows a variety of reaction products like LiF, Li2O and LixCHy which reveals the instability of the IL against lithium. Time resolved XPS spectra were discussed to distinguish cation reactions from beam damage effects. In a second step lithium is deposited on a [OMIm]Tf2N layer. The XPS spectra are in agreement with the results of the previous step, but show some differences concerning the [OMIm] cation. In a third step [OMIm]Tf2N has been deposited on a passivated lithium layer. XPS results show nearly unaffected [Tf2N] anions and partially decomposed [OMIm]+ cations. Interestingly the cation reactions show similarities when compared to the interaction of [C4C1Pyrr]Tf2N (1-butyl-1-methylpyrrolidinium bis[trifluoromethylsulfonyl]amide) and lithium.

Graphical abstract: Spectroscopic characterization of the interaction of lithium with thin films of the ionic liquid 1-octyl-3-methylimidazolium bis(trifluoromethylsulfonyl)amide

Supplementary files

Article information

Article type
Paper
Submitted
14 Jul 2014
Accepted
22 Oct 2014
First published
24 Oct 2014
This article is Open Access
Creative Commons BY license

Phys. Chem. Chem. Phys., 2014,16, 25969-25977

Author version available

Spectroscopic characterization of the interaction of lithium with thin films of the ionic liquid 1-octyl-3-methylimidazolium bis(trifluoromethylsulfonyl)amide

M. Olschewski, R. Gustus, M. Marschewski, O. Höfft and F. Endres, Phys. Chem. Chem. Phys., 2014, 16, 25969 DOI: 10.1039/C4CP03091E

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