Issue 15, 2014

CVD synthesis of large-area, highly crystalline MoSe2 atomic layers on diverse substrates and application to photodetectors

Abstract

Synthesis of large-area, atomically thin transition metal dichalcogenides (TMDs) on diverse substrates is of central importance for the large-scale fabrication of flexible devices and heterojunction-based devices. In this work, we successfully synthesized a large area of highly-crystalline MoSe2 atomic layers on SiO2/Si, mica and Si substrates using a simple chemical vapour deposition (CVD) method at atmospheric pressure. Atomic force microscopy (AFM) and Raman spectroscopy reveal that the as-grown ultrathin MoSe2 layers change from a single layer to a few layers. Photoluminescence (PL) spectroscopy demonstrates that while the multi-layer MoSe2 shows weak emission peaks, the monolayer has a much stronger emission peak at ∼1.56 eV, indicating the transition from an indirect to a direct bandgap. Transmission electron microscopy (TEM) analysis confirms the single-crystallinity of MoSe2 layers with a hexagonal structure. In addition, the photoresponse performance of photodetectors based on MoSe2 monolayer was studied for the first time. The devices exhibit a rapid response of ∼60 ms and a good photoresponsivity of ∼13 mA/W (using a 532 nm laser at an intensity of 1 mW mm−2 and a bias of 10 V), suggesting that MoSe2 monolayer is a promising material for photodetection applications.

Graphical abstract: CVD synthesis of large-area, highly crystalline MoSe2 atomic layers on diverse substrates and application to photodetectors

Supplementary files

Article information

Article type
Paper
Submitted
29 Apr 2014
Accepted
30 May 2014
First published
03 Jun 2014
This article is Open Access
Creative Commons BY license

Nanoscale, 2014,6, 8949-8955

CVD synthesis of large-area, highly crystalline MoSe2 atomic layers on diverse substrates and application to photodetectors

J. Xia, X. Huang, L. Liu, M. Wang, L. Wang, B. Huang, D. Zhu, J. Li, C. Gu and X. Meng, Nanoscale, 2014, 6, 8949 DOI: 10.1039/C4NR02311K

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