Issue 12, 2015

High reduction of interfacial charge recombination in colloidal quantum dot solar cells by metal oxide surface passivation

Abstract

Bulk heterojunction (BHJ) solar cells based on colloidal QDs and metal oxide nanowires (NWs) possess unique and outstanding advantages in enhancing light harvesting and charge collection in comparison to planar architectures. However, the high surface area of the NW structure often brings about a large amount of recombination (especially interfacial recombination) and limits the open-circuit voltage in BHJ solar cells. This problem is solved here by passivating the surface of the metal oxide component in PbS colloidal quantum dot solar cells (CQDSCs). By coating thin TiO2 layers onto ZnO-NW surfaces, the open-circuit voltage and power conversion efficiency have been improved by over 40% in PbS CQDSCs. Characterization by transient photovoltage decay and impedance spectroscopy indicated that the interfacial recombination was significantly reduced by the surface passivation strategy. An efficiency as high as 6.13% was achieved through the passivation approach and optimization for the length of the ZnO-NW arrays (device active area: 16 mm2). All solar cells were tested in air, and exhibited excellent air storage stability (without any performance decline over more than 130 days). This work highlights the significance of metal oxide passivation in achieving high performance BHJ solar cells. The charge recombination mechanism uncovered in this work could shed light on the further improvement of PbS CQDSCs and/or other types of solar cells.

Graphical abstract: High reduction of interfacial charge recombination in colloidal quantum dot solar cells by metal oxide surface passivation

Supplementary files

Article information

Article type
Paper
Submitted
20 Dec 2014
Accepted
04 Feb 2015
First published
09 Feb 2015

Nanoscale, 2015,7, 5446-5456

Author version available

High reduction of interfacial charge recombination in colloidal quantum dot solar cells by metal oxide surface passivation

J. Chang, Y. Kuga, I. Mora-Seró, T. Toyoda, Y. Ogomi, S. Hayase, J. Bisquert and Q. Shen, Nanoscale, 2015, 7, 5446 DOI: 10.1039/C4NR07521H

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