Issue 14, 2016

Single-crystal structure determination from microcrystalline powders (∼5 μm) by an orientation attachment mountable on an in-house X-ray diffractometer

Abstract

An X-ray attachment that can realize single-crystal X-ray diffraction patterns from microcrystalline powders is proposed. Single-crystal diffraction data are acquired in situ and analyzed using conventional computer software to determine the crystal structure of the microcrystals. The performance of the attachment is demonstrated using L-alanine microcrystals (∼5 μm).

Graphical abstract: Single-crystal structure determination from microcrystalline powders (∼5 μm) by an orientation attachment mountable on an in-house X-ray diffractometer

Supplementary files

Article information

Article type
Communication
Submitted
26 Nov 2015
Accepted
19 Jan 2016
First published
19 Jan 2016
This article is Open Access
Creative Commons BY-NC license

CrystEngComm, 2016,18, 2404-2407

Single-crystal structure determination from microcrystalline powders (∼5 μm) by an orientation attachment mountable on an in-house X-ray diffractometer

C. Tsuboi, K. Aburaya, F. Kimura, M. Maeyama and T. Kimura, CrystEngComm, 2016, 18, 2404 DOI: 10.1039/C5CE02307F

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