Issue 42, 2015
From the journal:

Nanoscale

Mid-infrared spectroscopy beyond the diffraction limit via direct measurement of the photothermal effect†

A. M. Katzenmeyer,a   G. Holland,a   J. Chae,ab   A. Band,a   K. Kjollerc  and  A. Centrone*a  

* Corresponding authors

a Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA
E-mail: andrea.centrone@nist.gov

b Maryland Nanocenter, University of Maryland, College Park, USA

c Anasys Instruments Inc., 325 Chapala Street, Santa Barbara, CA 93101, USA

Abstract

An atomic force microscope equipped with temperature sensitive probes was used to measure locally the photothermal effect induced by IR light absorption. This novel instrument opens a pathway to correlated topographical, chemical composition, and thermal mapping with nanoscale resolution. Proof of principle demonstration is provided on polymers and plasmonic samples.

Graphical abstract: Mid-infrared spectroscopy beyond the diffraction limit via direct measurement of the photothermal effect

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Article information

DOI
https://doi.org/10.1039/C5NR04854K
Article type
Communication
Submitted
20 Jul 2015
Accepted
15 Sep 2015
First published
30 Sep 2015

Nanoscale, 2015,7, 17637-17641

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Mid-infrared spectroscopy beyond the diffraction limit via direct measurement of the photothermal effect

A. M. Katzenmeyer, G. Holland, J. Chae, A. Band, K. Kjoller and A. Centrone, Nanoscale, 2015, 7, 17637 DOI: 10.1039/C5NR04854K

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