Issue 96, 2016

Grain boundary effects on Li-ion diffusion in a Li1.2Co0.13Ni0.13Mn0.54O2 thin film cathode studied by scanning probe microscopy techniques

Abstract

This paper presents the results of in situ characterization of grain boundary effects on Li-ion diffusion in Li1.2Co0.13Ni0.13Mn0.54O2 thin film cathode by using various Scanning Probe Microscopy (SPM) techniques. In particular, conductive-AFM results show that grain boundaries are more conductive than those in the grain interior. With the increase of bias voltage, the high conductive regimes extend from grain boundaries to interiors. Iā€“V curves show decreased current and increased voltage for current initiation when the tip is moved farther away from boundaries. Furthermore, positive and negative bias applied at grain boundary by biased-AFM can distinguish and manipulate the local Li-ion intercalation/de-intercalation processes at grain level in the cathode material without assembly of a full battery cell. Exfoliation and delamination, degradation and structural changes are observed when the Li-ions are move-out or move-into the layered structure of the cathode at the grain level. These results can provide important insights into understanding the Li-ion diffusion and aging mechanisms of cathode materials during charge/discharge processes.

Graphical abstract: Grain boundary effects on Li-ion diffusion in a Li1.2Co0.13Ni0.13Mn0.54O2 thin film cathode studied by scanning probe microscopy techniques

Supplementary files

Article information

Article type
Paper
Submitted
11 Jul 2016
Accepted
26 Sep 2016
First published
27 Sep 2016
This article is Open Access
Creative Commons BY license

RSC Adv., 2016,6, 94000-94009

Grain boundary effects on Li-ion diffusion in a Li1.2Co0.13Ni0.13Mn0.54O2 thin film cathode studied by scanning probe microscopy techniques

S. Yang, B. Yan, L. Lu and K. Zeng, RSC Adv., 2016, 6, 94000 DOI: 10.1039/C6RA17681J

This article is licensed under a Creative Commons Attribution 3.0 Unported Licence. You can use material from this article in other publications without requesting further permissions from the RSC, provided that the correct acknowledgement is given.

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