Issue 53, 2017, Issue in Progress

Metal-catalyst-free growth of graphene on insulating substrates by ammonia-assisted microwave plasma-enhanced chemical vapor deposition

Abstract

We study the metal-catalyst-free growth of uniform and continuous graphene films on different insulating substrates by microwave plasma-enhanced chemical vapor deposition (PECVD) with a gas mixture of C2H2, NH3, and H2 at a relatively low temperature of 700–750 °C. Compared to growth using only C2H2 and H2, the use of NH3 during synthesis is found to be beneficial, in transforming vertical graphene nano-walls into a layer-by-layer film, reducing the density of defects, and improving the graphene quality. The effect of different insulating substrates (including Al2O3 and SiO2) on the growth of graphene was studied under different growth temperatures, implying that the growth-temperature window and catalytic effect vary among insulators. The low activation energy barrier of Al2O3 proves it to be a more suitable substrate for the metal-catalyst-free growth of graphene at low temperature. These directly grown graphene films on insulators can be conveniently integrated into various electronic and optoelectronic applications avoiding any post-growth transfer processes.

Graphical abstract: Metal-catalyst-free growth of graphene on insulating substrates by ammonia-assisted microwave plasma-enhanced chemical vapor deposition

Article information

Article type
Paper
Submitted
12 Apr 2017
Accepted
26 Jun 2017
First published
30 Jun 2017
This article is Open Access
Creative Commons BY license

RSC Adv., 2017,7, 33185-33193

Metal-catalyst-free growth of graphene on insulating substrates by ammonia-assisted microwave plasma-enhanced chemical vapor deposition

S. Zheng, G. Zhong, X. Wu, L. D'Arsiè and J. Robertson, RSC Adv., 2017, 7, 33185 DOI: 10.1039/C7RA04162D

This article is licensed under a Creative Commons Attribution 3.0 Unported Licence. You can use material from this article in other publications without requesting further permissions from the RSC, provided that the correct acknowledgement is given.

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